Date of Award

January 2012

Document Type

Thesis

Degree Name

Master of Science (MS)

Department

Electrical Engineering

First Advisor

Sima Noghanian

Abstract

This thesis is a discussion of the design and implementation of benchmarking system for microwave imaging systems. The current benchmarking tools for microwave imaging setups are not adaptable. A novel method for of the development of a dielectric phantom using regression analysis is presented. This is followed by a discussion of the design of a novel sensor for the purpose of in vivo dielectric properties measurements. The goal is to provide information for microwave tomography algorithms and phantom development based on in vivo dielectric properties of breast tissues

Through the progress of this research two major novel advances have been made toward producing a better microwave imaging benchmark. First, a technique for systematically developing a breast phantom using regression analysis has been developed. This defines a process for researchers to produce a phantom quickly and easily, avoiding the simple trial and error development techniques of the past. Secondly, a method for measuring dielectric constant of a material through an embedded sensor was developed. Both advances are very important in producing accurate phantoms, providing in vivo tissue properties for tomography algorithms and designing matching materials for microwave imaging.

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